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《粉末衍射数据阶段识别软件》(Crystal Impact Match)更新v1.11a/含破解补丁[压缩包]

  • 状态: 精华资源
  • 摘要:
    发行时间2011年
    制作发行Crystal Impact
    语言英文
  • 时间: 2009/12/05 12:57:44 发布 | 2011/10/28 02:20:20 更新
  • 分类: 软件  应用软件 

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中文名粉末衍射数据阶段识别软件
英文名Crystal Impact Match
资源格式压缩包
版本更新v1.11a/含破解补丁
发行时间2011年
制作发行Crystal Impact
地区德国
语言英文
简介

IPB Image

引用
Installation:
Unpack&Install.
Move patch.exe to installdir and use it.
Also delete Onlineupdate.exe from intalldir (or block it from accessing network).

软件类型:应用软件
软件性质:免费破解软件
操作系统:Windows
应用平台:Microsoft Windows 98, ME, NT 4.0, 2000, XP or Vista operating system
问题反馈: brandenburg@crystalimpact.de
网站链接: http://www.crystalimpact.com/match/

软件介绍:

Crystal Impact Match是一款易用的粉末衍射数据阶段识别软件。通过把样本的粉末衍射形态与数据库中的参考形态进行比较,来确定样本所在阶段。通过提升ICSD(无机晶体结构数据库)的检索效率,提高参考模式数据库的价值。

Match!
Phase Identification from Powder Diffraction

Match! is an easy-to-use software for phase identification from powder diffraction data, which has become a daily task in material scientists work. Match! compares the powder diffraction pattern of your sample to a database containing reference patterns in order to identify the phases which are present. Single as well as multiple phases can be identified based on both peak data and raw (profile) data.
As reference database, you can apply the included free-of-charge IUCr/COD/AMCSD database and/or ICSD/Retrieve (if you have a valid licence), use any ICDD PDF product, and/or create a user database based on your own diffraction patterns. The user database patterns can be edited manually, imported from peak files, calculated from crystal structure data (e.g. CIF files), or imported from your colleague's user database.
A list of Match!'s most prominent features can be found here.

Match! Function List

* Fast single and multiple phase identification from powder diffraction data
* Use free-of-charge reference patterns calculated from the IUCr/ COD/AMCSD (incl. I/Ic), any ICSD/Retrieve version (released 1993-2002; valid licence required), any ICDD PDF database and/or your own diffraction data (or patterns calculated from crystal structure data (e.g. CIF files)) in phase identification
* Flexible handling of reference databases (incl. user databases); you can easily switch between different reference databases without the necessity to perform a new database indexation
* Create reference databases for neutron diffraction e.g. from cif-files
* Comfortable user database manager for easy maintenance of user data (add/import/edit/delete/sort entries)
* Powerful CIF- and ICSD/Retrieve import, incl. calculation of powder pattern, I/Ic and density
* Atomic coordinates available e.g. in the ICSD, the ICDD PDF-4+ or free-of-charge reference data are displayed in the data sheets and included in the CIF exports (e.g. for Rietveld analysis)
* View crystal structures in Diamond with just a few clicks
* Fully integrated handling of your own diffraction data with PDF data (search-match, retrieval, data viewing)
* Automatic residual searching with respect to identified phases
* Automatic raw data processing: α2-stripping, background subtraction, peak search, profile fitting, error correction
* Automatic optimization of peak searching sensitivity
* Fitting of all (or selected) peak parameters to exp. profile data
* Comfortable manual editing of peaks (add/shift/delete/fit) using mouse or keyboard
* Semi-quantitative analysis (Reference Intensity Ratio method)
* Straight-forward usage of additional knowledge (composition, PDF subfiles, crystallographic data, color, density etc.)
* Integrated database retrieval system and viewer for PDF and user datasheets
* Multiple step undo/redo
* Support for new PDF entry numbers (9 digits)
* User-configurable automatic operation
* Full parameter control with instant rearrangement of the results list
* Automatic d-value shifting during search-match process (optionally)
* Intensity contribution to figure-of-merit can be reduced for preferred-orientation cases
* Comfortable graphical and tabular comparison of peak data and candidate patterns
* Mouse-controlled pattern graphics zooming and tracking
* User-configurable HTML-reports
* Online update (automatic or manual)
* Supported diffraction data file formats (automatic detection):
o ASCII profile (start, step, intensities or 2 columns)
o Bruker/Siemens raw data (old and new) (*.raw)
o Bruker/Siemens DIFFRAC AT peak data (*.dif)
o DBWS (*.rfl, *.dat)
o ENDEAVOUR peak list (2 columns: 2theta/d intensity; *.dif)
o Inel raw data (*.dat)
o Ital Structures raw data (*.esg)
o Jade/MDI/SCINTAG raw data (*.mdi)
o JEOL ASCII Export raw data (*.txt)
o PANalytical XRDML Scan raw data (*.xrdml)
o PANalytical/Philips peak data (*.udi)
o PANalytical/Philips raw data (*.rd, *.udf)
o Rigaku raw data (*.raw)
o SCINTAG raw data (*.raw, *.rd)
o Shimadzu raw data (*.raw)
o Siemens (*.uxd)
o Sietronics XRD scan data (*.cpi)
o Stoe raw data (*.raw)
o Stoe peak data (*.pks)

Please contact Crystal Impact if the file format you are using is not yet supported!

引用
System requirements

* Personal Computer with Microsoft Windows 98, ME, NT 4.0, 2000, XP or Vista operating system
* Microsoft Internet Explorer 5.01 or higher
* 128 megabytes of RAM (256 megabytes recommended)
* Hard disk with minimum 600 MB of free disk space
* Graphics resolution of 1024 x 768 pixels with 32,768 colors ("High Color")
* DVD drive


IPB Image

IPB Image
代码
                           Match v1.9e (c) Crystal Impact                      

    ±   Disks: 12 x 5,00mb                              Date : December 3, 2009    ±
    °   OS   : Windows                                                            °

    ²  Release Description:
    ±  ~~~~~~~~~~~~~~~~~~~

       Match! is an easy-to-use software for phase identification from powder
       diffraction data, which has become a daily task in material scientists
       work. Match! compares the powder diffraction pattern of your sample to
       a database containing reference patterns in order to identify the phases
       which are present. Single as well as multiple phases can be identified
       based on both peak data and raw (profile) data.

       As reference database, you can apply the included free-of-charge
       IUCr/COD/AMCSD database and/or ICSD/Retrieve (if you have a valid
       licence), use any ICDD PDF product, and/or create a user database based
       on your own diffraction patterns. The user database patterns can be edited
       manually, imported from peak files, calculated from crystal structure data
       (e.g. CIF files), or imported from your colleague's user database.

     Installation:
    ²  """""""""""""""
    ±  Unpack&Install. Move patch.exe to installdir and use it. Also delete
    °  Onlineupdate.exe from intalldir (or block it from accessing network).

转贴自sharethefiles。
软件未经过安全检测和安装测试。
软件版权归原作者及原软件公司所有,如果你喜欢,请购买正版软件。

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